The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Mar. 11, 2020
Bruker Optik Gmbh, Ettlingen, DE;
Roland Harig, Waldbronn, DE;
Stephan Luettjohann, Karlsruhe, DE;
BRUKER OPTICS GMBH & CO. KG, Ettlingen, DE;
Abstract
An IR microscope includes an IR light source/interferometer () generating a collimated IR beam (), an effectively beam-limiting element () in a stop plane (), a sample position (), a detector () having an IR sensor (a), a detector stop (b), a first optical device focusing the collimated IR beam onto the sample position, and a second optical device imaging the sample position onto the IR sensor. The effectively beam-limiting element is situated in the collimated IR beam. The first and second optical devices image the detector stop opening into an input beam plane. For the area A1 of the image of the detector stop opening in the input beam plane and the area A2 of the cross section of the collimated IR beam in the input beam plane: 0<A1/A2≤1. Thereby, only collimated IR radiation is picked up, while vignetting and stray radiation are avoided.