The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jun. 12, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Christopher W. Steffen, Rochester, MN (US);

John P. Borkenhagen, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 29/26 (2006.01); G01R 31/319 (2006.01); G01R 31/28 (2006.01); H04W 16/14 (2009.01); H04L 1/20 (2006.01); H04L 7/04 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G01R 29/26 (2013.01); G01R 31/31709 (2013.01); G01R 31/31922 (2013.01); G01R 31/2822 (2013.01); H04L 1/205 (2013.01); H04L 7/04 (2013.01); H04L 2027/0065 (2013.01); H04W 16/14 (2013.01);
Abstract

On-chip spread spectrum characterization including obtaining, from a skitter circuit, skitter data comprising a spread width corresponding to an amplitude of a spread of a spread spectrum clock signal; setting an offset pointer to a center of the spread width corresponding to the amplitude of the spread; retrieving, for each of a number of reference clock cycles, edge data indicating a location, within the spread width, of an edge of the spread spectrum during the reference clock cycle; incrementing, using the edge data, an offset counter for each reference clock cycle during which the edge of the spread spectrum crosses the offset pointer; and calculating a frequency of the spread spectrum using the offset counter and the number of reference clock cycles.


Find Patent Forward Citations

Steffen, Christopher. (2023). On-chip spread spectrum characterization (U.S. Patent No. 11714127). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11714127

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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