The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

May. 23, 2022
Applicant:

Yazaki Corporation, Tokyo, JP;

Inventors:

Yasuyuki Mochizuki, Makinohara, JP;

Norio Sudo, Makinohara, JP;

Haruhiko Yoshida, Makinohara, JP;

Ryosuke Arigaya, Makinohara, JP;

Assignee:

YAZAKI CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2020.01); G01R 31/52 (2020.01); G01R 27/26 (2006.01); G01R 27/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/1227 (2013.01); G01R 27/025 (2013.01); G01R 27/2605 (2013.01); G01R 31/12 (2013.01); G01R 31/52 (2020.01);
Abstract

An earth fault detection apparatus includes a switch group configured to switch between a first measurement path including a battery and a capacitor, and a second and third measurement paths including the battery, a positive/negative-side insulation resistance, and the capacitor; a reference resistance and a test switch; and a control unit calculating a first reference value based on each charging voltage in a case where the test switch is opened and the capacitor is charged, and calculating the insulation resistance with reference to a conversion map created to correspond to an electrostatic capacitance between a power supply line and ground, wherein the control unit calculates a second reference value based on each charging voltage in a case where the test switch is closed and the capacitor is charged for a shorter time, and estimates the electrostatic capacitance with reference to a predetermined test conversion map.


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