The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Oct. 11, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Hideto Tamezane, Tokyo, JP;
Masaharu Nishida, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
The present invention relates to an improved abnormality determining method for an automatic analyzer and related automatic analyzer that detects abnormalities for a reaction process of a reaction solution. The method for determining the presence of absence of abnormalities in the reaction process and performs the determination by acquiring acquisition conditions for multiple items of measured data, acquiring the measured data detected by a spectral detector that match the acquisition conditions, calculating a feature quantity of the measured data, generating a determination criterion based on the feature quantity, and determining the presence or absence of abnormalities by comparing the feature quantity of the measured data subject to the determination with the determination criterion. The acquisition condition includes information relating to a number of a divisions of a measured value range and information relating to the number of items of data in each divided segment.