The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Oct. 20, 2021
Applicant:

Dongwoo Fine-chem Co., Ltd., Jeollabuk-do, KR;

Inventors:

Su Yeon Oh, Gyeonggi-do, KR;

Young Hoon Kim, Gyeonggi-do, KR;

Jun Hee Sung, Incheon, KR;

Assignee:

DONGWOO FINE-CHEM CO., LTD., Jeollabuk-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01B 11/28 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01B 11/28 (2013.01); G01N 2015/0038 (2013.01);
Abstract

A flow nanoparticle measurement device according to an embodiment of the present disclosure includes a flow cell configured to form a flow path through which a liquid sample flows, a laser generator configured to generate a first laser beam and irradiate the first laser beam to the flow cell, a plurality of detectors disposed in the flow cell and configured to detect a shock wave of a plasma generated in the flow cell by the first laser beam and generate a detection signal, and a controller configured to obtain the detection signal from the plurality of detectors and determine a type and a size of nanoparticles contained in the liquid sample in response to the detection signal.


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