The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Nov. 10, 2021
Applicant:

Ludong University, Yantai, CN;

Inventors:

Xueyan Li, Yantai, CN;

Zhenhua Zhang, Yantai, CN;

Zhi Cheng, Weifang, CN;

Xiaomin Xie, Xinzhou, CN;

Xiang Wan, Pucheng County, CN;

Assignee:

LUDONG UNIVERSITY, Yantai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 10/00 (2006.01);
U.S. Cl.
CPC ...
G01M 10/00 (2013.01);
Abstract

A measuring device for testing wave dissipation characteristics of a comb-typed permeable breakwater with arc-shaped walls in a flume is provided. The measuring device comprises three parts: a comb-typed permeable breakwater with arc-shaped walls, wave height measuring instrument fixing and adjusting devices, and a wave height measuring instrument data collecting and processing equipment. The comb-typed permeable breakwater with arc-shaped walls is formed by fixedly connecting upright arc-shaped caissons, a back plate, partition plates, L-shaped connecting plates and a bottom plate. The wave height measuring instrument fixing and adjusting devices are configured for accurately fixing the wave height measuring instrument and adjusting its horizontal position and vertical height. The wave height measuring instrument data collecting and processing equipment is configured for processing, outputting and displaying the data collected by the wave height measuring instrument. The measuring device has stable structure, strong operability and high experimental precision.


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