The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Dec. 27, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Babu Varghese, Eindhoven, NL;

Cornelis Willem Hameetman, Rotterdam, NL;

Walter Hermans, Overpelt, BE;

Arnold Johannes Martinus Jozeph Ras, Mierlo, NL;

Assignee:

KONINKLIIKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/443 (2013.01); A61B 5/0077 (2013.01); A61B 5/448 (2013.01); A61B 2562/0233 (2013.01);
Abstract

The invention provides a system () comprising a sensor () for measuring a skin parameter, the sensor () comprising a plurality of spatially separated light sources () configured to provide light source light (), and one or more detectors () configured at a first distance (d) from each of the light sources (), wherein the first distance (d) is selected from the range of 5-80 mm, wherein the sensor () is configured to provide the light source light () with optical axes (OL) under an angle (a) relative to an optical axis (O) of the one or more detectors () selected from the range of 10-80°, wherein the sensor () comprises at least three light sources (), wherein the light sources () are configured to provide unpolarized light source light (), wherein the system () further comprises an analysis system () wherein the analysis system () is configured to generate a corresponding skin sensor value on the basis of a detector response of the one or more detectors () at one or more wavelengths selected from a spectral range of 350-780 nm.


Find Patent Forward Citations

Loading…