The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Aug. 16, 2021
Applicant:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Inventors:

Brian Matthew White, Port Murray, NJ (US);

Ning Zhang, Warren, NJ (US);

Andrew F. Patka, Holliston, MA (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 28/02 (2009.01); H04W 28/24 (2009.01); H04L 67/30 (2022.01); H04W 12/06 (2021.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 28/0268 (2013.01); H04L 67/30 (2013.01); H04W 12/06 (2013.01); H04W 24/10 (2013.01); H04W 28/24 (2013.01);
Abstract

An application, executed by a User Equipment ('UE'), may receive an identifier, which may be used to monitor Key Performance Indicators ('KPIs') associated with the UE. Such KPIs may be monitored in conjunction with execution of the application, such as at times that the application sends and/or receives traffic. The KPIs may be associated with sensor data, resources, and/or other features or functionality of the UE. The UE may obtain an identifier associated with the application and/or the UE from a KPI monitoring system of some embodiments, may obtain user consent to monitor and/or report KPIs associated with the application, and may provide such KPIs to the KPI monitoring system in conjunction with the identifier. The KPI monitoring system may generate aggregated KPI information, associated with the application, based on the KPIs received from the UE and/or KPIs received from one or more other sources.


Find Patent Forward Citations

Loading…