The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Feb. 11, 2022
Panasonic Intellectual Property Corporation of America, Torrance, CA (US);
PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA, Torrance, CA (US);
Abstract
An EVM measurement value is appropriately determined while CPE/ICI correction is taken into account. In a measurement apparatus (), an EVM measurer () measures a modulation quality of a signal transmitted from a transmission apparatus. An EVM determiner () determines whether or not the measurement value of the modulation quality is equal to or less than a first requirement value, in a case where correction relating to a phase noise of the transmission apparatus is necessary in a reception apparatus. The first requirement value herein is higher than a second requirement value used in the determination of the measurement value in a case where the correction relating to the phase noise of the transmission apparatus is unnecessary in the reception apparatus.