The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Dec. 28, 2020
Hangzhou Dptech Technologies Co., Ltd., Zhejiang, CN;
Hangzhou DPtech Technologies Co., Ltd., Hangzhou, CN;
Abstract
A method of detecting abnormality may include the following steps. A normal-value range of a parameter for a target object is determined based on historical values of the parameter in a preset time period or at a preset time point. Whether the target object is abnormal is determined based on the normal-value range and the value of the parameter for the target object in the preset time period or at the preset time point within a current time cycle. Further, another normal-value range may be determined based on historical deviation values for the target object in historical time periods or at historical time points before the preset time period or the preset time point. Whether the target object is abnormal is determined based on either of the two normal-value ranges.