The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Dec. 29, 2020
Electronics and Telecommunications Research Institute, Daejeon, KR;
Hyun Chui Kang, Daejeon, KR;
Ho Jin Park, Daejeon, KR;
Ji Yeon Son, Daejeon, KR;
Eun Seo Lee, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
A method and apparatus for detecting an abnormality of a manufacturing facility is disclosed. According to an example embodiment of the present disclosure, a learning model generating method for manufacturing facility abnormality detection may include receiving a measured value for a normal state of a manufacturing facility collected through a multi-sensor on a time-by-time basis, generating a learning model including a predetermined weight set and training the learning model using the measured value, and determining, using the learning model, a threshold corresponding to a boundary between the normal state and an abnormal state of the manufacturing facility and a criterion for determining the abnormal state in a local window representing a predetermined time interval.