The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Nov. 25, 2019
Applicant:

Trimble Ab, Danderyd, SE;

Inventor:

Johan Von Matern, Danderyd, SE;

Assignee:

Trimble AB, Danderyd, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/66 (2006.01); G01S 17/08 (2006.01); G01S 17/50 (2006.01); G01S 7/484 (2006.01); G01S 7/486 (2020.01);
U.S. Cl.
CPC ...
G01S 17/66 (2013.01); G01S 17/08 (2013.01); G01S 17/50 (2013.01); G01S 7/484 (2013.01); G01S 7/486 (2013.01);
Abstract

A method implemented in a processing unit controlling a surveying instrument is provided. The method comprises obtaining a first set of data from optical tracking of a target with the surveying instrument, and identifying from the first set of data a dependence over time of at least one parameter representative of movements of the target. The method further comprises receiving a second set of data from a sensor unit via a communication channel, the second set of data including information about the at least one parameter over time, and determining whether a movement pattern for the optically tracked target as defined by the dependence over time of the at least one parameter is the same as, or deviates by a predetermined interval from, a movement pattern as defined by the dependence over time of the at least one parameter obtained from the second set of data.


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