The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

May. 28, 2021
Applicant:

Vayyar Imaging Ltd, Yehud, IL;

Inventors:

Yuval Lomnitz, Herzlia, IL;

Damian Hoffman, Zur Yizhak, IL;

Shachar Shayovitz, Ness Ziona, IL;

Assignee:

VAYYAR IMAGING LTD, Yehud, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 13/02 (2006.01); G01S 13/50 (2006.01); G01S 13/88 (2006.01); G01S 13/89 (2006.01); H01Q 3/34 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9005 (2013.01); G01S 13/0209 (2013.01); G01S 13/50 (2013.01); G01S 13/885 (2013.01); G01S 13/89 (2013.01); G01S 13/904 (2019.05); G01S 13/9029 (2013.01); H01Q 3/34 (2013.01);
Abstract

The methods and device disclosed herein provide an array such as a Radio Frequency (FR) antenna array for measuring the array movement or displacement of the array relative to a reference location. In some cases the array may be attached to or in communication with the device. The array comprises at least two transducers (e.g. RF antennas), wherein at least one of the at least two transducers is configured to transmit a signal towards the object, and at least one transceiver attached to said at least two transducers, the at least one transceiver is configured to repetitively transmit at least one signal toward an object and receive a plurality of signals affected or reflected while the array is moved in proximity to the object/medium or scene; and at least one processor unit, configured to: process the affected signals to yield a plurality of signal measurements and compare said signal measurements obtained at different locations over time of said second object and calculate a movement of the object relative to a reference location.


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