The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Dec. 01, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Taichi Tanaka, Tokyo, JP;

Osamu Hoshuyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/90 (2013.01);
Abstract

This invention is directed to an image processing apparatus that generates an evaluation index of a persistent scatterer likelihood without any influence of a large phase change with respect to a target whose displacement is nonlinear, a target whose elevation is high, or a target whose displacement is large. The image processing apparatus includes a phase array accumulator that accumulates phase arrays of respective pixels over a plurality of images, a clustering unit that classifies the respective pixels into a plurality of clusters based on the phase arrays, and a phase correlation calculator that calculates a correlation between a phase change in each of the plurality of clusters and the phase array at the respective pixels.


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