The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Mar. 16, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Yusaku Hioki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/724 (2013.01); H01J 49/045 (2013.01);
Abstract

Provided is a method for introducing into a probean eluate eluted from a component separation unitthat temporally separates components contained in a liquid sample, for obtaining charged particles, and for delivering the charged particles to a charged particle analysis unitprovided at a subsequent stage through a charged particle introduction opening, comprising steps of: supplying a gasification promoting gas for promoting gasification of the eluate and applying a predetermined charged-particle obtaining voltage to the probewhile the eluate is being introduced into the probe; and hindering the eluate nebulized by the probefrom moving toward the ion introduction openingonly in a time period other than a time period in which a target-component containing eluate is introduced into the probe


Find Patent Forward Citations

Hioki, Yusaku. (2023). Charged-particle supply control method and device (U.S. Patent No. 11709157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11709157

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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