The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Nov. 17, 2020
Applicant:

Spraying Systems Co., Wheaton, IL (US);

Inventors:

Chad Sipperley, Palm City, FL (US);

Rudolf J. Schick, Forest Park, IL (US);

Assignee:

Spraying Systems Co., Wheaton, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06V 10/70 (2022.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/0227 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06V 10/70 (2022.01);
Abstract

A particle measurement system and method of operation thereof are described. The system and method render a characteristic for a set of particles measured while passing through a measurement volume. The system includes a source that generates a particle-laden field containing the set of particles. The system further includes a sensor that generates a raw particle data corresponding to the set particles passing through the measurement volume of the particle measurement system, where the raw particle data comprises a set of raw particle records and each of one of the raw particle records includes a particle data content. A preconditioning stage carries out a preconditioning operation on the particle data content of the set of raw particle records to render a conditioned input data. A machine learning stage processes the conditioned input data to render an output characteristic parameter value for the set of particles.


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