The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Apr. 04, 2017
Covidien Ag, Neuhausen Am Rheinfall, CH;
Tyler Bywaters Rice, Santa Ana, CA (US);
Sean Michael White, Santa Ana, CA (US);
Bruce Yee Yang, Irvine, CA (US);
Covidien AG, Neuhausen am Rheinfall, CH;
Abstract
Devices, systems, and methods are disclosed for improved laser speckle imaging of samples, such as vascularized tissue, for the determination of the rate of movement of light scattering particles within the sample. The system includes a structure adjoining a light source and a photo-sensitive detector. The structure can be positioned adjacent the sample (e.g., coupled to the sample) and configured to orient the light source and detector relative the sample such that surface reflections, including specular reflections and diffuse reflections, are discouraged from entering the detection field of the detector. The separation distance along the structure between the light source and the detector may further enable selective depth penetration into the sample and biased sampling of multiply scattered photons. The system includes an operably coupled processor programmed to derive contrast metrics from the detector and to relate the contrast metrics to a rate of movement of the light scattering particles.