The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Jun. 21, 2019
Essilor International, Charenton-le-Pont, FR;
Cédric Lemaire, Charenton-le-Pont, FR;
Essilor International, Charenton-le-Pont, FR;
Abstract
Method for detecting a defect in a zone of interest of an optical lens, the method including: an image reception step, during which a plurality of images is received, each image includes a view of the zone of interest in front of a plurality of specific patterns, each specific pattern including a bright area and a dark area, and at least one image received is saturated in light intensity; a sampling step, during which each image of the plurality of images are sampled based on a common sampling pattern; a recombination step, during which a recombined image of the zone of interest is determined based on the common sampling pattern; and a defect detection step, during which a defect is detected in the zone of interest of the optical lens based on an analysis of the recombined image.