The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Sep. 28, 2020
Applicants:

Triad National Security, Llc, Los Alamos, NM (US);

Tohoku University, Sendai, JP;

Inventors:

Marcel Remillieux, Los Alamos, NM (US);

Yoshikazu Ohara, Tokyo, JP;

Assignees:

Triad National Security, LLC, Los Alamos, NM (US);

Tohoku University, Sendai, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01); G01B 11/25 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
G01H 9/004 (2013.01); G01B 11/25 (2013.01); G01H 9/008 (2013.01); G01N 29/043 (2013.01); G01N 29/069 (2013.01); G01N 29/2418 (2013.01);
Abstract

System include an ultrasonic transducer configured to couple to a nondestructive testing (NDT) sample and configured to produce and direct an ultrasonic probe wave at a selected frequency into a subsurface region of the NDT sample, a 3D laser scanning vibrometer configured to direct a detection beam in a scan area on a surface of the NDT sample and to receive a return beam from the scan area, and to detect, based on the return beam, a 3D motion of the surface across a wideband frequency range, and a processor, and a memory configured with instructions that, when executed by the processor, cause the processor to produce sub-surface image data of the NDT sample at multiple harmonics of the selected frequency in the wideband frequency range based on the detected 3D surface motion, wherein the sub-surface image data describes a nonlinear defect response produced in the NDT sample by interaction of the ultrasonic probe wave with the subsurface region.


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