The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Mar. 10, 2020
Omron Corporation, Kyoto, JP;
Shingo Hayashi, Kyoto, JP;
Akihisa Matsuyama, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
A position measurement method is used by a device including an imaging unit and a position detector that detects a position of the imaging unit to measure, using a detection value at imaging of a measurement point, position coordinates of the measurement point. The method for correcting the detection value from the position detector includes obtaining, with the device, position coordinates of predetermined indices () arranged two-dimensionally on a calibration plate () as an actual measurement value, obtaining, as a correction value, a difference between the actual measurement value and a true value resulting from transformation of position coordinates of the indices () with respect to a reference point on the calibration plate (), and correcting the detection value from the position detector (). The imaging unit () images measurement points (P) on the measurement target () to measure position coordinates of the measurement points (P).