The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Mar. 24, 2020
Applicant:

Proterial, Ltd., Tokyo, JP;

Inventors:

Chuya Aoki, Tokyo, JP;

Masayoshi Date, Tokyo, JP;

Toshiki Ishida, Tokyo, JP;

Assignee:

PROTERIAL LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 19/05 (2006.01); C22F 1/10 (2006.01);
U.S. Cl.
CPC ...
C22C 19/055 (2013.01); C22C 19/056 (2013.01); C22F 1/10 (2013.01);
Abstract

Provided are a Ni-based superalloy for stably obtaining high tensile strength and a method for manufacturing the same. Provided are: a Ni-based superalloy having a composition comprising, in mass %, C: up to 0.10%, Si: up to 0.5%, Mn: up to 0.5%, P: up to 0.05%, S: up to 0.050%, Fe: up to 45%, Cr: 14.0 to 22.0%, Co: up to 18.0%, Mo: up to 8.0%, W: up to 5.0%, Al: 0.10 to 2.80%, Ti: 0.50 to 5.50%, Nb: up to 5.8%, Ta: up to 2.0%, V: up to 1.0%, B: up to 0.030%, Zr: up to 0.10%, Mg: up to 0.005%, and the balance of Ni with inevitable impurities, and has a grain orientation spread (GOS) of at least 0.7° as an intragranular misorientation parameter measured by an SEM-EBSD technique; and a method for manufacturing the same.


Find Patent Forward Citations

Loading…