The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Jan. 21, 2021
Keylex Corporation, Hiroshima, JP;
Ryotaro Shinagawa, Hiroshima, JP;
Tadayoshi Takeuchi, Hiroshima, JP;
KEYLEX CORPORATION, Hiroshima, JP;
Abstract
A plate thickness test mechanism includes a detection section that detects an abnormality when a plate thickness is thinner than a desired plate thickness by a predetermined amount or more or thicker than the desired plate thickness by the predetermined amount or more, a determination section that determines whether or not the detection section functions normally, and a plate-shaped test jig that has a first plate portion having a plate thickness thinner than a predetermined specific plate thickness, and a second plate portion having a plate thickness thicker than the specific plate thickness. The determination section determines whether or not a plate thickness test is normally performed on the basis of a detection result of the detection section obtained when the detection section tests the plate thicknesses of the first and second plate portions by taking the desired plate thickness as the specific plate thickness.