The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2023

Filed:

Oct. 14, 2020
Applicant:

Canon Medical Systems Corporation, Tochigi, JP;

Inventors:

Weifeng Shang, Vernon Hills, IL (US);

Joseph Manak, Vernon Hills, IL (US);

John Baumgart, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/487 (2013.01); A61B 6/5258 (2013.01); G06T 7/11 (2017.01); G06T 2207/10121 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method of imaging includes obtaining a first image including projection data representing an intensity of X-rays detected by a plurality of detectors at a first X-ray exposure setting, the X-rays being emitted from an X-ray source; based on a detection result of a first object in the first image: determining a background region of interest (ROI) around the first object, the background ROI including background ROI pixels having a first intensity value corresponding to the intensity of the X-rays; and converting, for each pixel of the background ROI pixels, the first intensity values of the background ROI pixels to a normalized X-ray attenuation factor; and determining a second X-ray exposure setting for use in obtaining a second image based on the background ROI pixels converted to the normalized X-ray attenuation factor.


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