The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Oct. 22, 2020
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventor:
Michael Manhart, Fürth, DE;
Assignee:
Siemens Healthcare GmbH, Erlangen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/11 (2017.01); G06T 7/00 (2017.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); G06T 7/00 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); A61B 6/0407 (2013.01); A61B 6/4441 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01);
Abstract
Systems and methods for quantification of an influence of scattered radiation in the analysis of an object a projection image is provided. Based on the projection image and on a characteristic of a tomography facility and/or of the object relating to the influence of the scattered radiation, at least one intermediate image is created. The at least one intermediate image is analyzed using an artificial neural network to quantify the influence of the scattered radiation.