The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Mar. 14, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Daisuke Harada, Kyoto, JP;

Takuma Niizaka, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/32 (2023.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
H04N 5/32 (2013.01); G06T 5/50 (2013.01); G06T 2207/10124 (2013.01); G06T 2207/20212 (2013.01);
Abstract

In an X-ray imaging apparatus (), an image processor () is configured to apply a super-resolution process to a first region (A) in each of acquired images (Ia), the first region including a subject (S), and to increase a number of pixels according to an increase in resolution in the first region by application of the super-resolution process thereto by a simpler process than the super-resolution process with respect to a second region (A) other than the first region in each of the acquired images.


Find Patent Forward Citations

Harada, Daisuke. (2023). X-ray imaging apparatus (U.S. Patent No. 11706379). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11706379

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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