The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Mar. 01, 2021
Applicant:
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Inventors:
James B. West, Cedar Rapids, IA (US);
Jeffery A. Finley, Cedar Rapids, IA (US);
Assignee:
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/14 (2015.01); H04B 17/19 (2015.01);
U.S. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/14 (2015.01); H04B 17/19 (2015.01);
Abstract
A system and method for real-time in-situ calibration of an Active Electronically Scanned Array (AESA) utilizes an S-parameter matrix-based EM transfer function between an end fire, unobtrusive, near field probe radiating element to minimize AESA look angle blockage. A sniffer probe is integrated in the AESA aperture of mechanical mounting frame or embedded with the AESA aperture structure. Hadamard orthogonal coding is utilized to simultaneously energize AESA elements.