The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Apr. 20, 2020
Applicant:

Shanghai Fudan Microelectronics Group Company Limited, Shanghai, CN;

Inventors:

Chunyong Wu, Shanghai, CN;

Yang Liu, Shanghai, CN;

Lei Shen, Shanghai, CN;

Shusen Hao, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 3/33 (2006.01); G01R 31/50 (2020.01); H02H 3/16 (2006.01); H02H 3/04 (2006.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
H02H 3/335 (2013.01); G01R 31/50 (2020.01); H02H 1/0007 (2013.01); H02H 3/044 (2013.01); H02H 3/162 (2013.01);
Abstract

A ground fault circuit interrupter is provided, including a main control chip, a tripping unit and a self-test detection unit, wherein the tripping unit is connected with the self-test detection unit at a detection point and coupled with a load circuit; the self-test detection unit is coupled with the main control chip, and configured to detect a signal at the detection point and output the signal to the main control chip; the main control chip is coupled with the self-test detection unit, and configured to in a self-test state, simulate a circuit fault, perform self-test, and determine whether the circuit fault could be detected and an alarm signal response to the circuit fault is generated, based on the signal. A self-test function and alarm function response to a circuit fault in a ground fault circuit interrupter can be tested during a final test of production.


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