The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Jun. 30, 2020
Applicant:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Inventor:

Paul Barclay Purcell, Ouray, CO (US);

Assignee:

BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G01N 21/17 (2006.01); G01N 21/01 (2006.01); G01N 21/84 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06V 20/698 (2022.01); G01N 21/01 (2013.01); G01N 21/17 (2013.01); G01N 21/84 (2013.01); G06N 3/08 (2013.01); G01N 2021/0112 (2013.01); G01N 2021/0181 (2013.01); G01N 2021/0193 (2013.01); G01N 2021/1765 (2013.01); G01N 2021/845 (2013.01); G01N 2201/125 (2013.01);
Abstract

Aspects of the present disclosure include reconfigurable integrated circuits for characterizing particles of a sample in a flow stream. Reconfigurable integrated circuits according to certain embodiments are programmed to calculate parameters of a particle in a flow stream from detected light; compare the calculated parameters of the particle with parameters of one or more particle classifications; classify the particle based on the comparison between the parameters of the particle classifications and the calculated parameters of the particle; and adjust one or more parameters of the particle classifications based on the calculated parameters of the particle. Methods for characterizing particles in a flow stream with the subject integrated circuits are also described. Systems and integrated circuit devices programmed for practicing the subject methods, such as on a flow cytometer, are also provided.


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