The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Mar. 14, 2018
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Martin Schrader, Tampere, FI;

Radu Ciprian Bilcu, Tampere, FI;

Adrian Burian, Tampere, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/50 (2017.01); G06T 2207/10028 (2013.01);
Abstract

An apparatus that calibrates a parametric mapping that maps between object points and image points. The apparatus captures an image of a calibration pattern including features defining object points. The apparatus determines, from the image, measured image points that correspond to the object points. The apparatus determines, from the mapping, putative image points that correspond to the object points. The apparatus minimizes a cumulative cost function dependent upon differences between the measured image points and putative image points to determine parameters of the parametric mapping. The mapping uses a parametric function to specify points where light rays travelling from object points to image points cross the optical axis.


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