The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Nov. 25, 2020
Fujifilm Corporation, Tokyo, JP;
Yu Hasegawa, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
With a diagnostic imaging support apparatus, a diagnostic imaging support method, and a diagnostic imaging support program, an optimum image for extracting a contour can be automatically selected from a superimposed image obtained by superimposing a plurality of images of different types. A diagnostic imaging support apparatusincludes: an accepting unitthat accepts a specification of the position of a predetermined defined region R on a superimposed image G obtained by superimposing a plurality of images of different types including a target image Gthat is a target on which a contour is created; a selection unitthat selects an image for extracting a contour on the basis of image information about regions R, R, and R, in the plurality of images of different types, each corresponding to the accepted defined region R; and a contour extraction unitthat extracts the contour from the selected image.