The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Jul. 07, 2021
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Ning Wang, Shenzhen, CN;

Yibing Song, Shenzhen, CN;

Wei Liu, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/20 (2017.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06V 20/64 (2022.01); G06F 18/214 (2023.01); G06F 18/25 (2023.01); G06V 10/75 (2022.01); G06V 10/82 (2022.01); G06V 10/44 (2022.01); G06V 10/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/246 (2017.01); G06F 18/214 (2023.01); G06F 18/253 (2023.01); G06T 7/73 (2017.01); G06V 10/454 (2022.01); G06V 10/62 (2022.01); G06V 10/75 (2022.01); G06V 10/82 (2022.01); G06V 20/64 (2022.01); G06T 2207/20081 (2013.01);
Abstract

This application disclose a method for training a model performed at a computing device. The method includes: acquiring a template image and a test image; invoking a first object recognition model to process a feature of a tracked object in the template image to obtain a first reference response, and a second object recognition model to process the feature in the template image to obtain a second reference response; invoking the first model to process a feature of a tracked object in the test image to obtain a first test response, and the second model to process the feature to obtain a second test response; tracking the first test response to obtain a tracking response of the tracked object; and updating the first object recognition model based on differences between the first and second reference responses, that between the first and second test responses, and that between a tracking label and the tracking response.


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