The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Aug. 27, 2019
Topcon Corporation, Tokyo, JP;
Qi Yang, Foster City, CA (US);
Bisrat Zerihun, Santa Clara, CA (US);
Charles A. Reisman, Mamaroneck, NY (US);
TOPCON CORPORATION, Tokyo, JP;
Abstract
Machine learning technologies are used to identify and separating abnormal and normal subjects and identifying possible disease types with images (e.g., optical coherence tomography (OCT) images of the eye), where the machine learning technologies are trained with only normative data. In one example, a feature or a physiological structure of an image is extracted, and the image is classified based on the extracted feature. In another example, a region of the image is masked and then reconstructed, and a similarity is determined between the reconstructed region and the original region of the image. A label (indicating an abnormality) and a score (indicating a severity) can be determined based on the classification and/or the similarity.