The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Mar. 31, 2021
Shimadzu Corporation, Kyoto, JP;
Yusuke Yokoi, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A stress luminescence measurement method according to one aspect includes the steps of: placing a stress luminescent material on a surface of a sample; irradiating the stress luminescent material with excitation light; acquiring a first captured image by imaging the stress luminescent material during irradiation of the excitation light; applying a load to the sample; acquiring a stress luminescence image by imaging stress luminescence of the stress luminescent material; irradiating the stress luminescent material after removal of the load with the excitation light; acquiring a second captured image during irradiation of the excitation light by imaging the stress luminescent material in a state in which the load has been removed; and storing the first captured image and the second captured image in a memory in association with the stress luminescent image.