The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Jan. 29, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Adam Nicholas Lamar, Boise, ID (US);

Daniel Kokodoko, Oakland, CA (US);

Jay Kabin Slay, Boone, NC (US);

Gayathri Pandyaram, San Jose, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/17 (2019.01); G06F 16/14 (2019.01); G06F 11/32 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 16/1734 (2019.01); G06F 11/3075 (2013.01); G06F 11/324 (2013.01); G06F 11/3409 (2013.01); G06F 16/144 (2019.01);
Abstract

A data intake and query system establishes a network connection with an instrumented target system. The instrumented target system collects metrics in accordance with an instrumentation platform, whereby the instrumentation platform defines an instrumentation platform query. The metrics are stored in the data intake and query system. A data intake and query system query for a subset of metrics is transmitted. The data intake and query system query replicates the instrumentation platform query of the instrumentation platform. From the data store, log data for the instrumented target system, and correlated with the metrics to obtain correlated results.


Find Patent Forward Citations

Lamar, Adam. (2023). Metrics and log integration (U.S. Patent No. 11704285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11704285

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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