The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Jun. 25, 2021
The Johns Hopkins University, Baltimore, MD (US);
Gary L. Jackson, II, Laurel, MD (US);
Sterling E. Vinson, II, Columbia, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A test environment apparatus having processing circuitry is provided for testing an embedded system-under-test. The processing circuitry may be configured to implement the system-under-test for interaction with external test participants via messaging and control operation of an inner agent and an outer agent. The inner agent may be implemented within a virtual machine that is also implementing the system-under-test and the outer agent may be implemented external to the virtual machine implementing the system-under-test. The inner agent and the outer agent may be controlled to operate collaboratively to trigger captures of snapshots that store current states of the system-under-test at respective times and trigger a rollback of the system-under-test based on a timestamp of a delayed message using a snapshot for a selected time that provides a state of the system-under-test prior to the timestamp to permit subsequent delivery of the delayed message with the system-under-test in a rollback state.