The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Jan. 05, 2021
Applicant:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Inventors:

Suresh R. Nair, Nashua, NH (US);

Lee A. Lane, Medford, MA (US);

Brian J. Taylor, Boston, MA (US);

Yongyao Cai, Malden, MA (US);

Burt Sacherski, Nashua, NH (US);

Ashley M. Killian, Eastlake, OH (US);

Kevin Zomchek, Nashua, NH (US);

Michelle L. Poublon, Nashua, NH (US);

Linxi Gao, Reading, MA (US);

Timothy P. Wolfe, Medford, MA (US);

Rebecca R. Jaeger, Somerville, MA (US);

Wayne R. Foster, Tyngsborough, MA (US);

Assignee:

ROCKWELL AUTOMATION TECHNOLOGIES, INC., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G05B 23/0281 (2013.01); G05B 23/0291 (2013.01); G06N 20/00 (2019.01);
Abstract

A method for predicting end-of-life for a component includes determining a baseline lifetime model for a component connected to a machine functional safety system. The component is part of a system with physical devices. The method includes monitoring environmental conditions and usage conditions of the component and modifying the baseline lifetime model based on the monitored environmental and usage conditions to produce a modified lifetime model for the component. The method includes tracking a lifetime progress of the component with respect to the modified lifetime model and sending an alert in response to lifetime progress of the component reaching a lifetime threshold associated with the modified lifetime model.


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