The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Mar. 16, 2021
Applicant:

Festo SE & Co. KG, Esslingen, DE;

Inventors:

Roland Kälberer, Kirchheim, DE;

Jan Reimer, Esslingen, DE;

Tobias Rossbach, Plochingen, DE;

Assignee:

Festo SE & Co. KG, Esslingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0256 (2013.01); G01R 31/3177 (2013.01); G01R 31/31703 (2013.01);
Abstract

An input device including an input circuit with an input connection point for applying an input signal and with an input signal path which leads from the input connection point to an evaluation input and on which a conversion of the input signal into an evaluation signal is effected, an evaluation device which includes the evaluation input and which is designed to recognise an input signal level of the input signal on the basis of the evaluation signal, wherein the evaluation device is further designed to carry out a functionality test of the input device and within the framework of the functionality test by way of providing a test signal to effect a first change of the evaluation signal and to test the functionality of the input device on the basis of the effected first change of the evaluation signal, wherein the input circuit includes a transistor which is connected into the input signal path, and the input circuit is designed to control a control terminal of the transistor on the basis of the test signal, in order to effect the first change of the evaluation signal.


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