The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Nov. 12, 2019
Applicant:

Inventio Ag, Hergiswil, CH;

Inventors:

Andrea Cambruzzi, Zürich, CH;

Eliza Olczyk, Lucerne, CH;

Erich Butler, Ebikon, CH;

Oliver Simmonds, Lucerne, CH;

Philipp Zimmerli, Harkingen, CH;

Raphael Bitzi, Lucerne, CH;

Assignee:

INVENTIO AG, Hergiswil, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); B23B 39/08 (2006.01); G05B 19/18 (2006.01); G05B 19/19 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); B23B 39/08 (2013.01); G05B 19/182 (2013.01); G05B 19/19 (2013.01); G05B 19/401 (2013.01);
Abstract

A method and an assembly device for automated determination of a drilling position of a drill hole for a fastener for fastening a component to a possible wall area of a wall, wherein the method steps include: determining a surface contour of the wall area; examining the surface contour and detecting first irregularities in the surface contour using a first detection rule; determining a primary possible support surface area and a primary possible drilling position area that do not have any of the detected first irregularities; examining the surface contour of the primary possible drilling position area and detecting second irregularities in the surface contour using a second detection rule; and determining the drilling position inside the primary possible drilling position area such that the surface contour at the drilling position does not have any of the detected second irregularities.


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