The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Nov. 25, 2019
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Hideki Yamakawa, Osaka, JP;

Kazuma Nehashi, Osaka, JP;

Yu Takabatake, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/32 (2021.01); G01B 11/22 (2006.01); B23K 26/064 (2014.01); B23K 26/06 (2014.01); B23K 26/082 (2014.01); B23K 26/70 (2014.01);
U.S. Cl.
CPC ...
G02B 7/32 (2013.01); B23K 26/064 (2015.10); B23K 26/0643 (2013.01); B23K 26/082 (2015.10); G01B 11/22 (2013.01); B23K 26/707 (2015.10);
Abstract

A laser processing apparatus includes a laser light output section, a first scanner and a second scanner, a distance measurement light emitting section, a reference member which is arranged at a position which is the other end of a correction optical path formed with the distance measurement light emitting section as one end of the correction optical path and is arranged such that an optical path length of the correction optical path is a predetermined reference distance, a distance measurement light receiving section which receives distance measurement light reflected by the workpiece or the reference member, a distance measuring section which measures a distance to the workpiece or the reference member, and a distance correcting section which compares a measurement result of the distance to the reference member with the reference distance stored in advance to correct the measurement result obtained by the distance measuring section.


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