The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Nov. 26, 2018
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventors:
Assignee:
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/10 (2020.01); G01S 7/481 (2006.01); G01S 7/486 (2020.01); G01S 7/4865 (2020.01); G01S 7/4861 (2020.01); G01S 7/48 (2006.01); G01C 15/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G01S 17/10 (2013.01); G01C 15/002 (2013.01); G01S 7/481 (2013.01); G01S 7/4808 (2013.01); G01S 7/4861 (2013.01); G01S 7/4865 (2013.01); G02B 27/0043 (2013.01);
Abstract
An optical measuring device having a base for placing the measuring device and a targeting unit that is rotatable with respect to the base and defines a target axis for targeting a target object that is to be measured. The targeting unit has a first beam path for emitting optical measurement radiation in the direction of the target object that is to be measured. The targeting unit furthermore has a diffractive optical element (DOE), which is arranged or arrangeable in the beam path such that the optical measurement radiation is homogenized.