The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Sep. 29, 2020
Applicant:

Elemental Scientific, Inc., Omaha, NE (US);

Inventors:

Tyler Yost, Omaha, NE (US);

Jonathan Hein, Elkhorn, NE (US);

Jae Seok Lee, Burford, GA (US);

Dong Cherl Park, Hwasung, KP;

Assignee:

Elemental Scientific, Inc., Omaha, NE (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00613 (2013.01); G01N 35/00871 (2013.01); G01N 2035/009 (2013.01);
Abstract

A sample analysis system is available that can include a remote sampling system, at least one analyzer, and a controller. The remote sampling system can include a plurality of sample sources for providing a corresponding sample therefrom; and a plurality of sample collection devices selectively coupled to any of the plurality of sample sources for receiving at least one of the samples therefrom. The at least one analyzer can be coupled to the plurality of the sample collection devices for receiving at least one of the samples therefrom. The controller can be coupled with the remote sampling system and the at least one analyzer, the controller configured to control which of the sample sources is actively coupled to a given sample collection device at a given time.


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