The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Feb. 07, 2022
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki, JP;
Yutaka Nakai, Kanagawa, JP;
Tomio Ono, Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION, Kawasaki, JP;
Abstract
According to an embodiment, an inspection device includes a transmitter, a receiver, and a processor. The transmitter transmits a first ultrasonic wave including burst waves of a first period. The first ultrasonic wave is incident on an inspection object between the transmitter and the receiver. The first ultrasonic wave passed through the inspection object is incident on the receiver. The receiver outputs a signal corresponding to the first ultrasonic wave. The processor obtains the signal and performs a first operation. The first operation includes deriving first and second signal values from the signal, and inspecting the inspection object based on at least one of the first signal values and at least one of the second signal values. The first signal values correspond to maximum values of the signal in each of first periods The second signal values correspond to maximum values of the signal in each of second periods.