The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Oct. 30, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventor:

Samuel C. Howells, Portland, OR (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01J 5/10 (2006.01); G01J 5/00 (2022.01); G01J 5/60 (2006.01); G01J 5/0821 (2022.01); G01J 5/58 (2022.01); G01J 5/0818 (2022.01); G01J 5/08 (2022.01); G01J 5/53 (2022.01); G01J 5/80 (2022.01); H05B 3/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); G01J 5/0007 (2013.01); G01J 5/0818 (2013.01); G01J 5/0821 (2013.01); G01J 5/0896 (2013.01); G01J 5/53 (2022.01); G01J 5/58 (2013.01); G01J 5/60 (2013.01); G01J 5/80 (2022.01); H05B 3/0038 (2013.01);
Abstract

An apparatus for processing substrates includes a continuum radiation source, a source manifold optically coupled to the continuum radiation source and comprising: a plurality of beam guides, each having a first end that optically couples the beam guide to the continuum radiation source; and a second end. The apparatus also includes a detector manifold to detect radiation originating from the source manifold and transmitted through a processing area, and one or more transmission pyrometers configured to analyze the source radiation and the transmitted radiation to determine an inferred temperature proximate the processing area.


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