The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Jan. 16, 2018
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Hugh Charles Stevenson, Hughesdale, AU;

David Death, Melbourne, AU;

Eran Lande, Melbourne, AU;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01N 21/03 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01N 21/0332 (2013.01); G01N 21/274 (2013.01); G01N 2021/0367 (2013.01); G01N 2201/08 (2013.01);
Abstract

A method of optical analysis comprises receiving light at an optical spectrometer module from a light source, distributing the received light into two or more light beams with a light distribution component of the optical spectrometer module, concurrently exposing each of a reference and one or more test samples to one of the two or more light beams, and concurrently measuring a property of the light associated with each of the reference sample and one or more test samples with a corresponding detector.


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