The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Aug. 05, 2020
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Yosuke Okudaira, Tokyo, JP;

Akinobu Sugiura, Tokyo, JP;

Yasutoshi Aoki, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01C 15/00 (2006.01); G01C 3/02 (2006.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G01C 3/02 (2013.01);
Abstract

Provided is a surveying instrument configured so that the optical axis of a guide light irradiation unit that irradiates guide light for guiding a survey operator and the optical axis of a lens barrel portion of a distance-measuring optical system become parallel to each other on a horizontal plane. The guide light irradiation unit is not disposed above the lens barrel portion that substantially matches a collimation direction is horizontally shifted with respect to the lens barrel portion. The horizontal shift distance D is configured so that a horizontal distance D between the optical axis of guide light and the optical axis of the lens barrel portion satisfies tan(α/2)×Cmin>D provided that α is an irradiation angle of the guide light in the horizontal direction, and Cmin is a shortest use distance of the surveying instrument.


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