The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2023
Filed:
Jul. 23, 2020
Applicant:
Amcad Biomed Corporation, Taipei, TW;
Inventors:
Argon Chen, Taipei, TW;
Hao-Chien Wang, Taipei, TW;
Chiung-Nien Chen, Taipei, TW;
Pei-Lin Lee, Taipei, TW;
Chin-Chung Shu, Taipei, TW;
Edward Chia-Hao Liu, Taipei, TW;
Shu-Ning Yu, Taipei, TW;
Assignee:
AMCAD BIOMED CORPORATION, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/40 (2013.01); A61B 8/08 (2013.01); A61B 8/4209 (2013.01);
Abstract
The present disclosure provides a positioning method for head and neck assessment comprising positioning a probe to the head and neck structures of a subject according to reference planes defined by light beams.
Chen, Argon. (2023). Method for head and neck assessment or intervention (U.S. Patent No. 11701087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11701087
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile