The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2023

Filed:

Feb. 28, 2020
Applicant:

Taishi Watanabe, Tokyo, JP;

Inventor:

Taishi Watanabe, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/242 (2021.01); A61B 5/00 (2006.01); A61N 1/04 (2006.01); A61N 1/36 (2006.01);
U.S. Cl.
CPC ...
A61B 5/242 (2021.01); A61B 5/4041 (2013.01); A61B 2562/0223 (2013.01); A61N 1/0456 (2013.01); A61N 1/36014 (2013.01);
Abstract

A signal processing apparatus includes a memory, and a processor coupled to the memory and configured to perform a process including obtaining measurement data including a signal of interest and an interference signal generated in proximity to a signal source of the signal of interest, estimating a signal source in an extraction target area including the signal source of the signal of interest and a signal source of the interference signal based on the measurement data, selecting the signal source of the interference signal based on a result of the estimating a signal source and extracting interference signal data generated from the selected signal source of the interference signal, and extracting the signal of interest by removing a common part between the measurement data and the interference signal data.


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