The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Sep. 08, 2022
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventor:

Shoichi Nomura, Machida, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); H04N 1/32 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/32267 (2013.01); H04N 1/00129 (2013.01); H04N 1/00249 (2013.01); H04N 1/00352 (2013.01);
Abstract

An image inspection apparatus includes a first reader and a second reader that acquire read images by respectively reading one side and the other side of a sheet having an image printed thereon, a first background material and a second background material provided at positions as the backgrounds of the sheet in reading by the first reader and the second reader respectively, and a hardware processor that acquires sheet outline information from the read images and measures misalignment of the image with respect to the sheet based on the acquired sheet outline information. The hardware processor acquires read images with the first background material and the second background material having different densities, and acquires sheet outline information of one read image by estimating the sheet outline information of the one read image based on sheet outline information of the other of the read images.


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