The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2023
Filed:
Nov. 22, 2021
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventor:
Ha Young Ko, Seoul, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); H04N 13/133 (2018.01); G06V 10/141 (2022.01); G06F 18/22 (2023.01); H04N 25/71 (2023.01); H04N 23/45 (2023.01); H04N 23/71 (2023.01); H04N 23/72 (2023.01); H04N 25/60 (2023.01);
U.S. Cl.
CPC ...
G06T 5/007 (2013.01); G06F 18/22 (2023.01); G06T 5/50 (2013.01); G06V 10/141 (2022.01); H04N 13/133 (2018.05); H04N 23/45 (2023.01); H04N 23/71 (2023.01); H04N 23/72 (2023.01); H04N 25/60 (2023.01); H04N 25/745 (2023.01); G06T 2207/20021 (2013.01);
Abstract
A method of controlling parameters for image sensors includes; receiving a first image and a second image, calculating first feature values related to the first image and second feature values related to the second image; generating comparison results by comparing the first feature values of fixed regions and first variable regions of the first image with the second feature values of fixed regions and first variable regions of the second image, and controlling at least one parameter on the basis of the comparison results.