The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Sep. 11, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Arito Hashimoto, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 17/02 (2006.01); G06Q 10/06 (2023.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G05B 17/02 (2013.01); G05B 19/4183 (2013.01); G06Q 50/04 (2013.01);
Abstract

A control device and a monitoring system of a manufacturing device, capable of enabling an external device to acquire data easily without grasping a configuration of the control device having a plurality of function control units. A control device of a manufacturing device includes a display function control unit and a control function control unit. The display function control unit includes a data model generation unit, and the control function control unit includes a data model generation unit. The display function control unit includes: a data model acquiring unit that acquires a data model generated by the data model generation unit of the control function control unit; and a data model integration unit that integrates a data model generated by the data model generation unit of the display function control unit with a data model of the control function control unit acquired by the data model acquiring unit.


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